By Susan Brooks(eds.)
The booklet is worried with the idea, history, and functional use of transmission electron microscopes with lens correctors which can right the results of round aberration. The ebook additionally covers a comparability with aberration correction within the TEM and purposes of analytical aberration corrected STEM in fabrics technology and biology. This ebook is vital for microscopists all for nanoscale and fabrics microanalysis in particular these utilizing scanning transmission electron microscopy, and comparable analytical innovations reminiscent of electron diffraction x-ray spectrometry (EDXS) and electron power loss spectroscopy (EELS).Content:
Chapter 1 normal advent to Transmission Electron Microscopy (TEM) (pages 1–19): Peter Goodhew
Chapter 2 creation to Electron Optics (pages 21–38): Gordon Tatlock
Chapter three improvement of STEM (pages 39–53): L. M. Brown
Chapter four Lens Aberrations: analysis and Correction (pages 55–87): Andrew Bleloch and Quentin Ramasse
Chapter five idea and Simulations of STEM Imaging (pages 89–110): Peter D. Nellist
Chapter 6 information of STEM (pages 111–161): Alan Craven
Chapter 7 Electron power Loss Spectrometry and effort Dispersive X?ray research (pages 163–210): Rik Brydson and Nicole Hondow
Chapter eight purposes of Aberration?Corrected Scanning Transmission Electron Microscopy (pages 211–240): Mervyn D. Shannon
Chapter nine Aberration?Corrected Imaging in CTEM (pages 241–261): Sarah J. Haigh and Angus I. Kirkland
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Extra info for Aberration-Corrected Analytical Transmission Electron Microscopy
The choice depends largely on the beam current and energy spread that are required, together with the vacuum which can be maintained in the gun chamber. e. 8) where j is the current density and α is the semi-angle of the cone of electrons emerging from the surface of the gun. In all cases, electrons have to be extracted or emitted from a tip, which may be heated to encourage emission. Hence the choice of material for the tip is usually restricted to high melting point materials, such as tungsten, and/or low work function materials such as LaB6 , the latter owing to that fact that if conduction band electrons have to escape from a solid surface into a vacuum, they must overcome a potential barrier or work function at the surface.
The post specimen lenses are replaced by a series of detectors or spectrometers, and a combination of the signals from these detectors can then be used to optimize the image contrast. For example, since the high angle scattering is very sensitive to atomic number (see chapter 1), a high angle annular dark ﬁeld (HAADF) detector is very useful for the generation of direct atomic contrast images (see Chapter 3). 12 Comparison of TEM and STEM mode (after Reimer, 1989). a cutaway STEM currently in the Cavendish Museum at Cambridge together with a corresponding schematic diagram.
In fact, in principle, it is possible to link the imaging operation of the TEM and the STEM, which is known as the principle of reciprocity. 3 and also Chapters 5 and 6. Although, in principle, post specimen lenses may not be required after the sample in a STEM, it is often convenient to have some form of transfer lens after the sample so that, for example, the acceptance angle for an EEL Spectrometer can be optimised, as discussed in Chapter 6. Thus the main purpose of any post specimen lens is as a coupling lens to other detectors or spectrometers (see Chapter 3).
Aberration-Corrected Analytical Transmission Electron Microscopy by Susan Brooks(eds.)